ZEISS´Â ¿À´Â 4¿ù 13ÀÏ(¸ñ) ±¸¹ÌÀüÀÚÁ¤º¸±â¼ú¿ø¿¡¼ Àç·á ¿¬±¸
¹× ºÐ¼® Àü¹Ý¿¡ ÃÖ»óÀÇ ¼Ö·ç¼ÇÀ» Á¦°øÇÏ°íÀÚ ¡®Materials Science Workshop¡¯À» ÁøÇàÇÕ´Ï´Ù.
À̹ø ÀÚ¸®¸¦ ÅëÇØ SEM Àåºñ¿¡¼ºÎÅÍ FE-SEM, FIB, X-ray Çö¹Ì°æ±îÁö Àç·á ¿¬±¸¿¡
ÀûÇÕÇÑ ZEISSÀÇ ºÐ¼®±â¼ú¿¡ ´ëÇØ ¾Ë¾Æ°¡½Ç
¼ö ÀÖ´Â ÀÚ¸®°¡ µÇ±â ¹Ù¶ó¸ç
¸¹Àº °ü½É°ú Âü¿© ºÎŹ
µå¸³´Ï´Ù.
l ÀϽà : 2017³â 4¿ù 13ÀÏ(¸ñ) ¿ÀÈÄ 1½Ã 30ºÐ – 4½Ã 30ºÐ
l Àå¼Ò : ±¸¹ÌÀüÀÚÁ¤º¸±â¼ú¿ø (°æºÏ ±¸¹Ì)
l ÁÖÃÖ : ÀÚÀ̽º ÄÚ¸®¾Æ
l ÈÄ¿ø : ±¸¹ÌÀüÀÚÁ¤º¸±â¼ú¿ø (GERI)
l ÇÁ·Î±×·¥
Time
|
Program
|
Speaker
|
13:00
– 13:30
|
Registration
|
-
|
13:30
– 14:15
|
An Introduction of SEM for Material Science
|
Ãֹα⠰úÀå (ZEISS)
|
14:15
– 15:00
|
ZEISS Crossbeam – Advancing
Capabilities in High Throughput 3D Analysis and Nanofabrication
|
¹Úº´ÁØ Â÷Àå(ZEISS)
|
15:00
– 15:15
|
Break
|
-
|
15:15
– 16:00
|
ZEISS X-ray Microscopy: 3D & 4D Imaging for
Materials Science
|
Mr.
Jin Yoon(ZEISS)
|
16:00
– 16:30
|
GERI FIB Demonstration Tour
|
±èÁö¼ö ¿¬±¸¿ø(GERI)
|
l Âü°¡½Åû : ½Åû ÆäÀÌÁö ³» ¾ç½Ä ä¿î µÚ Á¦Ãâ
https://www.zeiss.co.kr/microscopy/local-content/news-and-events/2017/materials-science-workshop.html
l ¹®ÀÇ : ÀÚÀ̽º ÄÚ¸®¾Æ Çö¹Ì°æ »ç¾÷ºÎ °È¿¸² ´ë¸®
(Email : hyolim.kang@zeiss.com
/ Tel : 02-3140-2729)
l ±âŸ
¾È³» : °ÀÇ ÇÁ·Î±×·¥Àº ¸ðµÎ ¹«·á·Î Á¦°øµÇ¸ç, ÁÖÂ÷ °ø°£Àº
¹«·á·Î »ç¿ëÇÏ½Ç ¼ö ÀÖ½À´Ï´Ù.
|