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The Korean Institute of Metals and Materials

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Á¦  ¸ñ [ZEISS] ÃֽŠÀç·á°úÇÐ ±â¼ú ¹× ÀÀ¿ë ¿öÅ©¼¥ (4/13, GERI)
ÀÛ¼ºÀÚ À¯½ÃÇö »ç¿ø µî·ÏÀÏ 2017-03-16 À̸ÞÀÏ mmi@kim.or.kr Á¶È¸¼ö 2248

ZEISS´Â ¿À´Â 4¿ù 13ÀÏ(¸ñ) ±¸¹ÌÀüÀÚÁ¤º¸±â¼ú¿ø¿¡¼­ Àç·á ¿¬±¸ ¹× ºÐ¼® Àü¹Ý¿¡ ÃÖ»óÀÇ ¼Ö·ç¼ÇÀ» Á¦°øÇÏ°íÀÚ ¡®Materials Science Workshop¡¯À» ÁøÇàÇÕ´Ï´Ù.

À̹ø ÀÚ¸®¸¦ ÅëÇØ SEM Àåºñ¿¡¼­ºÎÅÍ FE-SEM, FIB, X-ray Çö¹Ì°æ±îÁö Àç·á ¿¬±¸¿¡ ÀûÇÕÇÑ ZEISSÀÇ ºÐ¼®±â¼ú¿¡ ´ëÇØ ¾Ë¾Æ°¡½Ç ¼ö ÀÖ´Â ÀÚ¸®°¡ µÇ±â ¹Ù¶ó¸ç ¸¹Àº °ü½É°ú Âü¿© ºÎŹ µå¸³´Ï´Ù.

 

l  ÀϽà : 2017³â 4¿ù 13ÀÏ(¸ñ) ¿ÀÈÄ 1½Ã 30ºÐ – 4½Ã 30ºÐ

l  Àå¼Ò : ±¸¹ÌÀüÀÚÁ¤º¸±â¼ú¿ø (°æºÏ ±¸¹Ì)

l  ÁÖÃÖ : ÀÚÀ̽º ÄÚ¸®¾Æ

l  ÈÄ¿ø : ±¸¹ÌÀüÀÚÁ¤º¸±â¼ú¿ø (GERI)

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Time

Program

Speaker

13:00 13:30

Registration

-

13:30 14:15

An Introduction of SEM for Material Science

Ãֹα⠰úÀå (ZEISS)

14:15 15:00

ZEISS Crossbeam Advancing Capabilities in High Throughput 3D Analysis and Nanofabrication

¹Úº´ÁØ Â÷Àå(ZEISS)

15:00 15:15

Break

-

15:15 16:00

ZEISS X-ray Microscopy: 3D & 4D Imaging for Materials Science

Mr. Jin Yoon(ZEISS)

16:00 16:30

GERI FIB Demonstration Tour

±èÁö¼ö ¿¬±¸¿ø(GERI)

 

l  Âü°¡½Åû : ½Åû ÆäÀÌÁö ³» ¾ç½Ä ä¿î µÚ Á¦Ãâ

https://www.zeiss.co.kr/microscopy/local-content/news-and-events/2017/materials-science-workshop.html

l  ¹®ÀÇ : ÀÚÀ̽º ÄÚ¸®¾Æ Çö¹Ì°æ »ç¾÷ºÎ °­È¿¸² ´ë¸®

(Email : hyolim.kang@zeiss.com / Tel : 02-3140-2729)

l  ±âŸ ¾È³» : °­ÀÇ ÇÁ·Î±×·¥Àº ¸ðµÎ ¹«·á·Î Á¦°øµÇ¸ç, ÁÖÂ÷ °ø°£Àº ¹«·á·Î »ç¿ëÇÏ½Ç ¼ö ÀÖ½À´Ï´Ù

 
÷ºÎÆÄÀÏ [ZEISS-Invitation] Materials Science Workshop_20170413.pdf